SECONDARY-ELECTRON EMISSION IN THE SCANNING ELECTRON-MICROSCOPE

被引：809

作者：

SEILER, H

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1983年 / 54卷 / 11期

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D O I：

10.1063/1.332840

中图分类号：

O59 [应用物理学];

学科分类号：

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页码：R1 / R18

页数：18

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[1] SECONDARY ELECTRON-ESCAPE PROBABILITIES
ALIG, RC
BLOOM, S
[J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (06) : 3476 - 3480
[2] FINE STRUCTURE MEASUREMENTS IN ENERGY ANGULAR DISTRIBUTION OF SECONDARY ELECTRONS FROM A (110) FACE OF COPPER
APPELT, G
[J]. PHYSICA STATUS SOLIDI, 1968, 27 (02): : 657 - &
[3] SINGLE-CRYSTAL OF YAG - NEW FAST SCINTILLATOR IN SEM
AUTRATA, R
SCHAUER, P
KVAPIL, J
KVAPIL, J
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1978, 11 (07): : 707 - 708
[4] AUTRATA R, 1982, ELECTRON MICROS, P451
[5] COMPARISON OF THE NOISE OF DIFFERENT ELECTRON DETECTION SYSTEMS USING A SCINTILLATOR-PHOTOMULTIPLIER COMBINATION
BAUMANN, W
REIMER, L
[J]. SCANNING, 1981, 4 (03) : 141 - 151
[6] BEGRAMBE.LB, 1971, FIZ TVERD TELA+, V13, P379
[7] BEISSWENGER S, 1974, OPTIK, V40, P518
[8] THE SECONDARY-ELECTRON EMISSION COEFFICIENT OF DISORDERED SURFACES
BOUCHARD, C
CARETTE, JD
[J]. SURFACE SCIENCE, 1980, 100 (01) : 241 - 250
[9] RESOLUTION IN SURFACE-SCANNING ELECTRON-MICROSCOPY OF BULK SAMPLES
BROERS, AN
[J]. ULTRAMICROSCOPY, 1982, 8 (1-2) : 137 - 144
[10] Bronshtein I.M., 1969, HONCHNAYA ELECTRONNA

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