SECONDARY-ELECTRON EMISSION IN THE SCANNING ELECTRON-MICROSCOPE

被引：809

作者：

SEILER, H

机构：

来源：

关键词：

D O I：

10.1063/1.332840

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：R1 / R18

页数：18

共 157 条

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