Well-width dependence of exciton-phonon scattering in InxGa1-xAs/GaAs single quantum wells

被引:59
作者
Borri, P
Langbein, W
Hvam, JM
Martelli, F
机构
[1] Tech Univ Denmark, Mikroelekt Ctr, DK-2800 Lyngby, Denmark
[2] Fdn Ugo Bordoni, I-00142 Rome, Italy
关键词
D O I
10.1103/PhysRevB.59.2215
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The temperature and density dependencies of the exciton dephasing time in In0.18Ga0.82As/GaAs single quantum wells with different thicknesses have been measured by degenerate four-wave mixing; The exciton-phonon scattering contribution to the dephasing is isolated by extrapolating the dephasing rate to zero-exciton density. From the temperature dependence of this rate we have deduced the linewidth broadening coefficients for acoustic and optical phonons. We find acoustic-phonon coefficients that increase from 1.6 to 3 mu eV/K when increasing the well width from 1 to 4 nm. This is in quantitative agreement with theoretical predictions when the spatial extension of the exciton wave function, strongly penetrating into the GaAs barrier in thin InxGa1-xAs quantum wells, is taken into account. The optical-phonon coefficient does not show a systematic dependence on well thickness, and is comparable with the value for bulk GaAs. [S0163-1829(99)02103-7].
引用
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页码:2215 / 2222
页数:8
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