STM Observation on Layered Nitride Superconductor KxTiNCl

被引：3

作者：

Sugimoto, Akira ^{[1
]}

Shohara, Kazuhiro ^{[1
]}

Ekino, Toshikazu ^{[1
]}

Yamanaka, Shoji

机构：

[1] Hiroshima Univ, Grad Sch Integrated Arts & Sci, Higashihiroshima 7398521, Japan

来源：

25TH INTERNATIONAL CONFERENCE ON LOW TEMPERATURE PHYSICS (LT25), PT 5A: SUPERCONDUCTIVITY | 2009年 / 150卷 / 5a期

关键词：

D O I：

10.1088/1742-6596/150/5/052251

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

Scanning tunneling microscopy (STM) measurements of an alpha (FeOCl) type layered nitride superconductor K(x)TiNCl (x similar to 0.5) with T(C) similar to 16 K are carried out. STM topographies show clear rectangular-shaped atomic distribution with the periods of vertical bar(a) over right arrow vertical bar=0.41 nm and vertical bar(b) over right arrow vertical bar=0.33 nm, which correspond to those observed by X-ray measurement. One-dimensional streaky structures are observed at negative biases, which is considered to be arising from N 2p - Ti 3d hybrid bands of the TiN double layers. Both negative and positive STM topographies exhibit the enhanced inhomogeneous background, which can be attributed to the intercalated potassium and/or doped carrier.

引用

页数：4

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