Electrical breakdown of ultra-thin polyimide Langmuir-Blodgett films under a needle-plane electrode system

被引:5
作者
Fukuzawa, M
Ikedou, H
Iwamoto, M
机构
[1] Tokyo Inst Technol, Dept Phys Elect, Meguro Ku, Tokyo 1528552, Japan
[2] Kyushu Sangyo Univ, Dept Elect Engn, Higashi Ku, Fukuoka 8138503, Japan
关键词
space charge; polyimide; Langmuir-Blodgett; electrical breakdown;
D O I
10.1016/S0040-6090(03)00789-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Electrostatic phenomena occurring at insulator-metal interfaces are interesting to the fields of electronics. In this study, we examined the surface potential of electrical insulating polyimide (PI) Langmuir-Blodgett (LB) films on metal (Al and Au) electrodes, which were charged at various voltages under a needle-plane electrode system. PI LB films were negatively charged as the biasing voltage applied to the needle-electrode increased. The surface potential saturated when the number of deposited layers was 20-30, and it was dependent on the nature of metal electrode. The interfacial electrostatic space charge at the as-deposited film/metal interface made a significant contribution to the dielectric breakdown of ultra-thin films. As a result, PI LB films deposited on Al electrode were broken at lower voltage than that on Au electrode. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:243 / 247
页数:5
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