Unusual semimetallic behavior of carbonized ion-implanted polymers

被引:35
作者
Du, G
Prigodin, VN
Burns, A
Joo, J
Wang, CS
Epstein, AJ
机构
[1] Ohio State Univ, Dept Phys, Columbus, OH 43210 USA
[2] AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia
[3] Univ Dayton, Res Inst, Dayton, OH 45469 USA
来源
PHYSICAL REVIEW B | 1998年 / 58卷 / 08期
关键词
D O I
10.1103/PhysRevB.58.4485
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report a comprehensive charge transport study of ion-implanted rigid rod and ladder polymers p-phenylenebenzobisoxazoIe, p-pbenylenebenzobisthiazole, and benzimidazobenzophenanthroline. The three pristine materials are strong and stable polymers with a room temperature conductivity sigma(RT)similar to 10(-12) Slcm. After high dosage ion implantation using Kr+, a carbonized and conducting layer forms on the surface of the film samples with sigma(RT) > 10(2) S/cm. The experimental results suggest that this carbonized layer is semimetallic with unusual properties. The observed de conductivity follows sigma(T)=sigma(0)+Delta(sigma)(T), where Delta sigma(T) is weakly temperature dependent and interpreted within the model of weak localization and electron-electron interaction effects. The model reveals that the interaction effect is three dimensional for the experimental temperature range (3-300 K), whereas the weak localization effect undergoes a dimensional crossover at similar to 60 K from three to two-dimensions with decreasing temperature. The magnetoconductance, thermoelectric power, and microwave dielectric constant results are all in agreement with this semimetallic model. In addition, all these results consistently point to an enhanced interaction effect at low temperatures due to the reduced dimensionality of the localization effect. It is concluded that a sp(2) rich and three-dimensional interconnected carbon network reformed upon ion implantation of the densely packed pristine polymers is responsible for the semimetallic behavior.
引用
收藏
页码:4485 / 4495
页数:11
相关论文
共 39 条
[1]  
Altshuler B. L., 1985, Electron-electron interactions in disordered systems, P1
[2]   WEAK LOCALIZATION IN THIN-FILMS - A TIME-OF-FLIGHT EXPERIMENT WITH CONDUCTION ELECTRONS [J].
BERGMANN, G .
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1984, 107 (01) :1-58
[3]  
Buranov LJ, 1971, PRIB TEKH EKSP, V2, P171
[4]  
BURNS A, 1992, MATER RES SOC SYMP P, V247, P735
[5]  
BURNS G, 1985, SOLID STATE PHYSICS
[6]   MINIMUM METALLIC CONDUCTIVITY AND THERMOPOWER IN THIN PALLADIUM FILMS [J].
BURNS, MJ ;
MCGINNIS, WC ;
SIMON, RW ;
DEUTSCHER, G ;
CHAIKIN, PM .
PHYSICAL REVIEW LETTERS, 1981, 47 (22) :1620-1624
[7]  
Carter G., 1976, Ion implantation of semiconductors
[8]   APPARATUS FOR THERMOPOWER MEASUREMENTS ON ORGANIC CONDUCTORS [J].
CHAIKIN, PM ;
KWAK, JF .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1975, 46 (02) :218-220
[9]  
Chambers R.G, 1990, ELECT METAL SEMICOND
[10]   LOW-TEMPERATURE TRANSPORT IN THE HOPPING REGIME - EVIDENCE FOR CORRELATIONS DUE TO EXCHANGE [J].
DAI, PH ;
ZHANG, YZ ;
SARACHIK, MP .
PHYSICAL REVIEW LETTERS, 1992, 69 (12) :1804-1806