Crystallization and orientation of C60 from C60/polymethyl methacrylate films

The crystallization and orientation behaviors of C-60 for C-60-doped polymethyl methacrylate films are reported. The results show a high tendency of crystallization of C-60 with increasing its content, and a preferential (111) orientation for heavily doped films upon high-temperature annealing. The expansion of the lattice constant and the existence of hexagonal close-packed stacking faults are also investigated. The orientation phenomenon indicates an efficient method for the growth of (111)-oriented C-60 on a variety of substrates, including those with strong surface bondings on which the orientation is difficult to form via conventional methods. (C) 1995 American Institute of Physics. [S0003-6951(98)03825-X].