HRTEM investigation of PZT-C60 thin films

被引：1

作者：

Miyazawa, K ^{[1
]}

机构：

[1] Univ Tokyo, Sch Engn, Dept Mat Engn, Tokyo 1138656, Japan

来源：

SURFACE ENGINEERING | 2001年 / 17卷 / 01期

关键词：

D O I：

10.1179/026708401101517584

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Lead zirconate titanate (PZT, Zr/Ti = 52:46) thin films with added C-60 were prepared by firing at 400 degreesC in air. The films were then examined by high resolution transmission electron microscopy (HRTEM). Analysis of the lattice constants and HRTEM images suggested that C-60 precipitates retained in the films were polymerised. Perovskite PZT crystals were observed in contact with the C-60 precipitates, indicating that he C60 precipitates acted as nucleation sites for the pervoskite phase of PZT. (C) 2001 IoM Communications Ltd.

引用

页码：38 / 40

页数：3

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