Intrinsic defects and electronic conductivity of TaON: First-principles insights

被引:32
作者
Chen, Shiyou [1 ]
Wang, Lin-Wang [1 ]
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA
关键词
ab initio calculations; antisite defects; catalysis; doping; electrical conductivity; interstitials; oxidation; photochemistry; stoichiometry; tantalum compounds; vacancies (crystal); VISIBLE-LIGHT IRRADIATION; TANTALUM OXYNITRIDE; PHOTOCATALYST;
D O I
10.1063/1.3664346
中图分类号
O59 [应用物理学];
学科分类号
摘要
Using hybrid functional calculations we show that TaON has different defect properties from the binary tantalum oxide and nitride: (i) instead of O or N vacancies or Ta interstitials, the O-N antisite is the dominant defect, which determines its intrinsic n-type conductivity and the p-type doping difficulty; (ii) the O-N antisite has a shallower donor level than O or N vacancies, with a delocalized distribution composed mainly of the Ta 5d orbitals, which gives rise to better electronic conductivity in the oxynitride than in the oxide and nitride. The phase stability analysis reveals that further oxidation of TaON is possible when the oxygen chemical potential is high (O rich); thus, a low oxygen partial pressure is required to synthesize stoichiometric TaON samples. (C) 2011 American Institute of Physics. [doi:10.1063/1.3664346]
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页数:3
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