Orientation transition in a thick laser deposited YBa2Cu3O7-x film observed by glancing angle X-ray diffraction

被引：17

作者：

Park, JH ^{[1
]}

Lee, SY ^{[1
]}

机构：

[1] Yonsei Univ, Dept Elect Engn, Seoul 120749, South Korea

来源：

PHYSICA C | 1999年 / 314卷 / 1-2期

关键词：

pulsed laser deposition (PLD); YBa2Cu3O7-x (YBCO); glancing angle X-ray diffraction; orientation;

D O I：

10.1016/S0921-4534(99)00030-1

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Pulsed laser deposition (PLD) has been used to fabricate superconducting YBa2Cu3O7-x (YBCO) films on MgO substrates. A Nd:YAG laser with a wavelength of 355 nm tvas used to grow I mu m and 2 mu m thick YBCO films. The relation of thickness and orientation in laser ablated films was systematically investigated by X-ray diffraction (XRD). The electrical property and the structural characteristics of YBCO films have been studied by R-T measurement and XRD. Glancing angle XRD pattern reveals the film orientation is changed from fully c-axis near the substrates/film interface to the mixture of a-axis and c-axis near the film surface. The intensity of the a-axis fraction is increased as going to near the film surface and as growing thicker films. We could get c-axis-oriented YBCO films by optimizing the film thickness and the deposition temperature. (C) 1999 Published by Elsevier Science B.V. All rights reserved.

引用

页码：112 / 116

页数：5

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