Statistics of local field intensity enhancements at nanostructured surfaces investigated with a near-field optical microscope

被引:27
作者
Bozhevolnyi, SI
Coello, V
机构
[1] Univ Aalborg, Inst Phys, DK-9220 Aalborg, Denmark
[2] Univ San Nicolas de los Garza Nuevo, Ctr Invest Cientif & Estudios Super Ensenada BC, Leon, Mexico
关键词
D O I
10.1103/PhysRevB.64.115414
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Near-field intensity distributions measured at nanostructured surfaces with a scanning near-field optical microscope are treated to determine the statistics of local field intensity enhancements. The probability density function (PDF) of the field intensity enhancement is calculated for surface-plasmon-polariton scattering by randomly rough surfaces of thin metal films and for light scattering in silver colloid fractals. We demonstrate that the statistics of the intensity distributions established in different scattering regimes, viz., single and multiple scattering, is distinctly different, and compare our results with the theoretical predictions available. We show that. in the regime of multiple scattering, the PDF decreases exponentially for large values of the intensity enhancement with the slope for surface-plasmon scattering being significantly different from that for light scattering in surface fractal structures. We also find that, in the latter case, the PDF slope is only weakly influenced by variations in the wavelength and polarization of incident radiation.
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页数:7
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共 35 条
  • [1] LOCALIZATION OF THE SURFACE-PLASMON POLARITON CAUSED BY RANDOM ROUGHNESS AND ITS ROLE IN SURFACE-ENHANCED OPTICAL PHENOMENA
    ARYA, K
    SU, ZB
    BIRMAN, JL
    [J]. PHYSICAL REVIEW LETTERS, 1985, 54 (14) : 1559 - 1562
  • [2] Localization phenomena in elastic surface-polariton scattering caused by surface roughness
    Bozhevolnyi, SI
    [J]. PHYSICAL REVIEW B, 1996, 54 (11) : 8177 - 8185
  • [3] Fractal surface characterization: Implications for plasmon polariton scattering
    Bozhevolnyi, SI
    Vohnsen, B
    Zayats, AV
    Smolyaninov, II
    [J]. SURFACE SCIENCE, 1996, 356 (1-3) : 268 - 274
  • [4] DIRECT OBSERVATION OF SURFACE POLARITON LOCALIZATION CAUSED BY SURFACE-ROUGHNESS
    BOZHEVOLNYI, SI
    VOHNSEN, B
    SMOLYANINOV, II
    ZAYATS, AV
    [J]. OPTICS COMMUNICATIONS, 1995, 117 (5-6) : 417 - 423
  • [5] NEAR-FIELD MICROSCOPY OF SURFACE-PLASMON POLARITONS - LOCALIZATION AND INTERNAL INTERFACE IMAGING
    BOZHEVOLNYI, SI
    SMOLYANINOV, II
    ZAYATS, AV
    [J]. PHYSICAL REVIEW B, 1995, 51 (24): : 17916 - 17924
  • [6] Direct observation of localized dipolar excitations on rough nanostructured surfaces
    Bozhevolnyi, SI
    Markel, VA
    Coello, V
    Kim, W
    Shalaev, VM
    [J]. PHYSICAL REVIEW B, 1998, 58 (17): : 11441 - 11448
  • [7] Elastic scattering of surface plasmon polaritons: Modeling and experiment
    Bozhevolnyi, SI
    Coello, V
    [J]. PHYSICAL REVIEW B, 1998, 58 (16) : 10899 - 10910
  • [8] Transfer functions in collection scanning near-field optical microscopy
    Bozhevolnyi, SI
    Vohnsen, B
    Bozhevolnaya, EA
    [J]. OPTICS COMMUNICATIONS, 1999, 172 (1-6) : 171 - 179
  • [9] Bozhevolnyi SI, 1999, ANN PHYS-BERLIN, V8, P717, DOI 10.1002/(SICI)1521-3889(199911)8:7/9<717::AID-ANDP717>3.0.CO
  • [10] 2-N