A 2.4-GHz low-IF receiver for wideband WLAN in 0.6-μm CMOS -: Architecture and front-end

被引:63
作者
Behbahani, F [1 ]
Leete, JC
Kishigami, Y
Roithmeier, A
Hoshino, K
Abidi, AA
机构
[1] Univ Calif Los Angeles, Dept Elect Engn, Integrated Circuits & Syst Lab, Los Angeles, CA 90095 USA
[2] Asahi Chem Ind Co Ltd, Fuji, Shizuoka 416, Japan
关键词
D O I
10.1109/4.890304
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents the 2.4-GHz front-end and the first downconversion section of a fully integrated low-IF receiver. The dual-conversion receiver and rejects the image repeatably by 60 dB using integrated polyphase filters without calibration or tuning, The gain of the RF mixer and IF amplifier is switchable to slide the available dynamic range of the following stages based on the conditions of the input signal, The front-end and downconversion sections drain 35 mA on average from a 3.3-V supply. Minimum cascade noise figure is 7.2 dB, and maximum cascade IIP3 is -3.4 dBm.
引用
收藏
页码:1908 / 1916
页数:9
相关论文
共 19 条
[1]   HIGH-FREQUENCY NOISE MEASUREMENTS ON FETS WITH SMALL DIMENSIONS [J].
ABIDI, AA .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1986, 33 (11) :1801-1805
[2]   De-embedding the noise figure of differential amplifiers [J].
Abidi, AA ;
Leete, JC .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1999, 34 (06) :882-885
[3]  
Behbahani F., 1999, 1999 Symposium on VLSI Circuits. Digest of Papers (IEEE Cat. No.99CH36326), P83, DOI 10.1109/VLSIC.1999.797244
[4]  
BEHBAHANI F, 2000, IEEE INT SOL STAT CI, P146
[5]  
BEHBAHANI F, IN PRESS IEEE J SOLI
[6]  
BEHBAHANI F, 1999, THESIS U CALIFORNIA
[7]   ADAPTIVE COMPENSATION FOR IMBALANCE AND OFFSET LOSSES IN DIRECT CONVERSION TRANSCEIVERS [J].
CAVERS, JK ;
LIAO, MW .
IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY, 1993, 42 (04) :581-588
[8]   A single-chip 900 MHz CMOS receiver front-end with a high performance low-IF topology [J].
Crols, J ;
Steyaert, MSJ .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1995, 30 (12) :1483-1492
[9]   Noise in RF-CMOS mixers: A simple physical model [J].
Darabi, H ;
Abidi, AA .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2000, 35 (01) :15-25
[10]   The impact of scaling down to deep submicron on CMOS RF circuits [J].
Huang, QT ;
Piazza, F ;
Orsatti, P ;
Ohguro, T .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1998, 33 (07) :1023-1036