A tangentially viewing fast ion D-alpha diagnostic for NSTX

被引：27

作者：

Bortolon, A. ^{[1
]}

Heidbrink, W. W. ^{[1
]}

Podesta, M. ^{[2
]}

机构：

[1] Univ Calif Irvine, Irvine, CA 92697 USA

[2] Princeton Plasma Phys Lab, Princeton, NJ 08543 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 10期

关键词：

D O I：

10.1063/1.3495768

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A second fast ion D-alpha (FIDA) installation is planned at NSTX to complement the present perpendicular viewing FIDA diagnostics. Following the present diagnostic scheme, the new diagnostic will consist of two instruments: a spectroscopic diagnostic that measures fast ion spectra and profiles at 16 radial points with 5-10 ms resolution and a system that uses a band pass filter and photomultiplier to measure changes in FIDA light with 50 kHz sampling rate. The new pair of FIDA instruments will view the heating beams tangentially. The viewing geometry minimizes spectral contamination by beam emission or edge sources of background emission. The improved velocity-space resolution will provide detailed information about neutral-beam current drive and about fast ion acceleration and transport by injected radio frequency waves and plasma instabilities. (C) 2010 American Institute of Physics. [doi:10.1063/1.3495768]

引用

页数：4

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