Mapping the spin-dependent electron reflectivity of Fe and Co ferromagnetic thin films

被引：22

作者：

Graf, J ^{[1
]}

Jozwiak, C

Schmid, AK

Hussain, Z

Lanzara, A

机构：

[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA

[2] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

[3] Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA

来源：

PHYSICAL REVIEW B | 2005年 / 71卷 / 14期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1103/PhysRevB.71.144429

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Spin polarized low energy electron microscopy is used as a spin-dependent spectroscopic probe to study the spin-dependent specular reflection of a polarized electron beam from two different magnetic thin film systems: Fe/W(110) and Co/W(110). The reflectivity and spin-dependent exchange-scattering asymmetry are studied as a function of electron kinetic energy and film thickness, as well as the time dependence. The largest value of the figure of merit for spin polarimetry is observed for a five monolayer thick film of Co/W(110) at an electron kinetic energy of 2 eV. This value is 2 orders of magnitude higher than previously obtained with state of the art mini-Mott polarimeter. We discuss implications of our results for the development of an electron-spin-polarimeter using the exchange-interaction at low energy.

引用

页数：5

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