Inherent possibilities and restrictions of plasma immersion ion implantation systems

被引:55
作者
Mandl, S
Brutscher, J
Gunzel, R
Moller, W
机构
[1] Research Center Rossendorf, Inc., Institute for Ion Beam Physics and Materials Research, D-01314 Dresden
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1996年 / 14卷 / 04期
关键词
D O I
10.1116/1.589007
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Design specifications for plasma immersion ion implantation systems are discussed. An analytical model of the plasma sheath evolution is used to deduce restrictions for the dimension of the vacuum chamber and the pressure range. The avoidance of arcing implies an upper limit for the maximum electric field in the sheath and hence for the plasma density. The total fluence per pulse, which determines the implantation duration and the power requirement, is calculated. Furthermore, safety considerations, especially the shielding of x-rays generated by secondary electrons, are discussed. (C) 1996 American Vacuum Society.
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页码:2701 / 2706
页数:6
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