Nanostructural and surface morphological evolution of chemically sprayed SnO2 thin films

被引：66

作者：

Chacko, Saji ^{[1
]}

Philip, Ninan Sajeeth ^{[1
]}

Gopchandran, K. G. ^{[2
]}

Koshy, Peter ^{[3
]}

Vaidyan, V. K. ^{[4
]}

机构：

[1] St Thomas Coll, Dept Phys, Kozhencheri 689641, India

[2] Univ Kerala, Dept Optoelect, Trivandrum 695581, Kerala, India

[3] Dept Electron Microscopy, Reg Res Lab, Trivandrum 19, Kerala, India

[4] Univ Kerala, Dept Phys, Trivandrum 695581, Kerala, India

来源：

APPLIED SURFACE SCIENCE | 2008年 / 254卷 / 07期

关键词：

oxygen vacancies; structural and optical properties; IR band at 530 cm(-1) in SnO2 thin films;

D O I：

10.1016/j.apsusc.2007.09.027

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Physical properties of a nanocrystalline thin film is greatly influenced by its morphological and structural evolution. We try to understand the transition of SnO2 thin films from amorphous to nanocrystalline structure with XRD, IR, SEM, AFM and surface profiler studies. A 2D layer like structure resulting from quantum confinement is found for the films prepared at 400 degrees C. We observed a new IR band at 530 cm(-1) that was theoretically predicted and report it for the first time. A correlation of population of defects in SnO2 films with change in lattice parameters and FWHM of IR bands are reported. The electric and optical properties of the films have been discussed. (c) 2007 Elsevier B.V. All rights reserved.

引用

页码：2179 / 2186

页数：8

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