Dislocation density analysis in single grains of steel by X-ray scanning microdiffraction

被引：19

作者：

Castelnau, O

Drakopoulos, M

Schroer, C

Snigireva, I

Snigirev, A

Ungar, T

机构：

[1] European Synchrotron Radiat Facil, Expt Div, F-38043 Grenoble, France

[2] Univ Paris 13, CNRS, LPMTM, F-93430 Villetaneuse, France

[3] Rhein Westfal TH Aachen, Inst Phys 2, D-52056 Aachen, Germany

[4] Eotvos Univ Budapest, Inst Gen Phys, H-1445 Budapest, Hungary

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2001年 / 467卷

关键词：

X-ray micro-diffraction; single grain; diffraction line broadening; dislocation density;

D O I：

10.1016/S0168-9002(01)00638-6

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new set-up for X-ray micro-diffraction has been developed on the ESRF beamline ID22. It allows microscopic characterization of materials with micrometer resolution. This facilitates the measurement of material quantities as average size of the coherently diffracting volume, local dislocation density, residual stress, local fluctuation of the residual stress, and intragranular misorientation from single grains of a polycrystalline material. The first application on an IF-Ti steel after different thermo-mechanical treatments is presented, (C), 2001 Elsevier Science B.V. All rights reserved.

引用

页码：1245 / 1248

页数：4

共 10 条

[1] An X-ray method for the determination of stored energies in texture components of deformed metals;: Application to cold worked ultra high purity iron [J].