Biaxially aligned YBCO film tapes fabricated by all pulsed laser deposition

Biaxially aligned yttria-stabilized zirconia (YSZ) films on Ni-based alloy substrates were realized with high deposition rate of 0.5 mum min(-1) by the inclined substrate deposition (ISD) technique without ion beam assistance. The microstructure of YSZ was examined to study the growth mechanism of biaxial alignment by ISD. Columnar structures toward the plasma plume suggested a self-shadowing effect in the ISD process. To raise I-c values, YBCO thickness was increased up to 5 mum. Thick YBCO films with high J(c) values were realized on the ISD-grown YSZ. Long YBCO tapes with biaxial alignment were successfully fabricated using continuous pulsed laser deposition and a high I-c value of 37.0 A (77.3 K, 0 T) at a 75 cm voltage tap spacing was achieved. (C) 1998 Elsevier Science Ltd. All rights reserved.