Purity assessment of single-wall carbon nanotubes, using optical absorption spectroscopy

被引:138
作者
Landi, BJ [1 ]
Ruf, HJ [1 ]
Evans, CM [1 ]
Cress, CD [1 ]
Raffaelle, RP [1 ]
机构
[1] Rochester Inst Technol, NanoPower Res Labs, Rochester, NY 14623 USA
关键词
D O I
10.1021/jp044990c
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A demand currently exists for a method of assessing the purity of single-wall carbon nanotubes (SWNTs), which will allow for meaningful material comparisons. An established metric and protocol will enable accurate and reproducible purity claims to be substantiated. In the present work, the ability to accurately quantify the mass fraction of SWNTs in the carbonaceous portion of a given sample is demonstrated, using optical absorption spectroscopy on both laser and arc discharge-generated SWNT-N,N-dimethylacetamide (DMA) dispersions. Verification of purity assessment protocols is based upon constructed sample sets comprising designed mass fractions of purified SWNTs and representative carbonaceous synthesis byproducts. Application of a previously reported method (Itkis et al. Nano Lett. 2003, 3, 309) based on a ratio of the areal absorbance from linear subtractions of the second interband electronic transitions of semiconducting SWNTs (E-s(22)) has shown a severe overestimation of SWNT purity (average error > 24%). Instead, the development of a nonlinear, pi-plasmon model, which considers overlap of electronic transitions and peak broadening, has dramatically improved the purity assessment accuracy (average error < 7%), derived from a strong correlation to the constructed sample sets. This approach has enabled corroboration of rapid assessment procedures, such as absorbance peak maxima ratio and Beer's law analysis, directed at purification monitoring and synthesis sample screening. Specifically, a simple protocol for purity assessment of laser and arc-discharge SWNTs has been established that can be extended to other synthetic types (i.e. CVD, HiPco, etc.) and diameter distributions.
引用
收藏
页码:9952 / 9965
页数:14
相关论文
共 62 条
[1]   Protocol for the characterization of single-wall carbon nanotube material quality [J].
Arepalli, S ;
Nikolaev, P ;
Gorelik, O ;
Hadjiev, VG ;
Bradlev, HA ;
Holmes, W ;
Files, B ;
Yowell, L .
CARBON, 2004, 42 (8-9) :1783-1791
[2]   Carbon nanotube transistors and logic circuits [J].
Avouris, P ;
Martel, R ;
Derycke, V ;
Appenzeller, J .
PHYSICA B-CONDENSED MATTER, 2002, 323 (1-4) :6-14
[3]   Triplet state dissociation of C120, the dimer of C60 [J].
Bachilo, SM ;
Benedetto, AF ;
Weisman, RB .
JOURNAL OF PHYSICAL CHEMISTRY A, 2001, 105 (43) :9845-9850
[4]   Structure-assigned optical spectra of single-walled carbon nanotubes [J].
Bachilo, SM ;
Strano, MS ;
Kittrell, C ;
Hauge, RH ;
Smalley, RE ;
Weisman, RB .
SCIENCE, 2002, 298 (5602) :2361-2366
[5]   Dissolution of small diameter single-wall carbon nanotubes in organic solvents? [J].
Bahr, JL ;
Mickelson, ET ;
Bronikowski, MJ ;
Smalley, RE ;
Tour, JM .
CHEMICAL COMMUNICATIONS, 2001, (02) :193-194
[6]   Purification of single-wall carbon nanotubes by microfiltration [J].
Bandow, S ;
Rao, AM ;
Williams, KA ;
Thess, A ;
Smalley, RE ;
Eklund, PC .
JOURNAL OF PHYSICAL CHEMISTRY B, 1997, 101 (44) :8839-8842
[7]   Low energy plasmon peaks in the electron energy loss spectra of single-wall carbon nanotubes [J].
Bose, SM .
PHYSICS LETTERS A, 2001, 289 (4-5) :255-256
[8]   Complete elimination of metal catalysts from single wall carbon nanotubes [J].
Chattopadhyay, D ;
Galeska, I ;
Papadimitrakopoulos, F .
CARBON, 2002, 40 (07) :985-988
[9]   Purification and characterization of single-wall carbon nanotubes [J].
Chiang, IW ;
Brinson, BE ;
Smalley, RE ;
Margrave, JL ;
Hauge, RH .
JOURNAL OF PHYSICAL CHEMISTRY B, 2001, 105 (06) :1157-1161
[10]   Purification and characterization of single-wall carbon nanotubes (SWNTs) obtained from the gas-phase decomposition of CO (HiPco process) [J].
Chiang, IW ;
Brinson, BE ;
Huang, AY ;
Willis, PA ;
Bronikowski, MJ ;
Margrave, JL ;
Smalley, RE ;
Hauge, RH .
JOURNAL OF PHYSICAL CHEMISTRY B, 2001, 105 (35) :8297-8301