Low-resistance Pt/Ni/Au ohmic contacts to p-type GaN

被引:157
作者
Jang, JS [1 ]
Chang, IS
Kim, HK
Seong, TY
Lee, SH
Park, SJ
机构
[1] Kwangju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju 506712, South Korea
[2] Kwangju Inst Sci & Technol, Ctr Elect Mat Res, Kwangju 506712, South Korea
关键词
D O I
10.1063/1.123954
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on a Pt (20 nm) Ni (30 nm)/Au (80 nm) metallization scheme for low-resistance ohmic contacts to the moderately doped p-type GaN:Mg (3X10(17) cm(-3)). Both as-deposited and annealed Pt/Ni/Au contacts on p-GaN exhibit linear current-voltage characteristics, showing that a high-quality ohmic contact is formed. The Pt/Ni/Au scheme shows the specific contact resistance of 5.1X10(-4) Ohm cm(2) when annealed at 350 degrees C for 1 min in a flowing N-2 atmosphere. (C) 1999 American Institute of Physics. [S0003-6951(99)03101-0].
引用
收藏
页码:70 / 72
页数:3
相关论文
共 19 条
  • [1] Very low resistance multilayer ohmic contact to n-GaN
    Fan, ZF
    Mohammad, SN
    Kim, W
    Aktas, O
    Botchkarev, AE
    Morkoc, H
    [J]. APPLIED PHYSICS LETTERS, 1996, 68 (12) : 1672 - 1674
  • [2] METAL CONTACTS TO GALLIUM NITRIDE
    FORESI, JS
    MOUSTAKAS, TD
    [J]. APPLIED PHYSICS LETTERS, 1993, 62 (22) : 2859 - 2861
  • [3] Effects of surface treatments and metal work functions on electrical properties at p-GaN/metal interfaces
    Ishikawa, H
    Kobayashi, S
    Koide, Y
    Yamasaki, S
    Nagai, S
    Umezaki, J
    Koike, M
    Murakami, M
    [J]. JOURNAL OF APPLIED PHYSICS, 1997, 81 (03) : 1315 - 1322
  • [4] JANG JK, UNPUB
  • [5] JANG JS, 1998, 2 INT S BLUE LAS LIG
  • [6] JANG JS, 1998, THESIS KWANGJU I SCI
  • [7] JANG JS, IN PRESS J VAC SCI B
  • [8] KHAN MA, 1993, APPL PHYS LETT, V63, P1214, DOI 10.1063/1.109775
  • [9] HIGH-RESPONSIVITY PHOTOCONDUCTIVE ULTRAVIOLET SENSORS BASED ON INSULATING SINGLE-CRYSTAL GAN EPILAYERS
    KHAN, MA
    KUZNIA, JN
    OLSON, DT
    VANHOVE, JM
    BLASINGAME, M
    REITZ, LF
    [J]. APPLIED PHYSICS LETTERS, 1992, 60 (23) : 2917 - 2919
  • [10] KHAN MA, 1993, APPL PHYS LETT, V62, P1786, DOI 10.1063/1.109549