Dissociative adsorption of silane on the Si(100)-(2x1) surface

被引:50
作者
Brown, AR [1 ]
Doren, DJ [1 ]
机构
[1] Univ Delaware, Dept Chem & Biochem, Newark, DE 19716 USA
关键词
D O I
10.1063/1.477986
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Density functional theory calculations have been used to explore the mechanism of dissociative adsorption of silane (SiH4) on the Si(100)-(2 X 1) surface. Two reaction paths are described that produce silyl (SiH3) and hydrogen atom fragments adsorbed on the dimer dangling bonds. The energy barrier on the lowest energy path is 12-14 kcal/mol (depending on the details of the theoretical method used), while the barrier on the other path is about 17 kcal/mol. The initial step in both mechanisms is abstraction of a hydrogen atom from silane by an electron-deficient surface atom. It is also possible for the surface to react by forming a bond between the more electron-rich surface atom and the silane Si atom. This latter reaction path has a prohibitively high barrier (39 kcal/mol), and it leads to different products (adsorbed SiH2 and elimination of H-2) . These results are discussed in the context of Si film growth kinetics, ultrahigh vacuum studies of silane adsorption and other theoretical studies of silicon surface chemistry. (C) 1999 American Institute of Physics. [S0021-9606(99)70905-0].
引用
收藏
页码:2643 / 2651
页数:9
相关论文
共 39 条
[1]   DENSITY-FUNCTIONAL THERMOCHEMISTRY .3. THE ROLE OF EXACT EXCHANGE [J].
BECKE, AD .
JOURNAL OF CHEMICAL PHYSICS, 1993, 98 (07) :5648-5652
[2]   DENSITY-FUNCTIONAL EXCHANGE-ENERGY APPROXIMATION WITH CORRECT ASYMPTOTIC-BEHAVIOR [J].
BECKE, AD .
PHYSICAL REVIEW A, 1988, 38 (06) :3098-3100
[3]  
Brown AR, 1998, J CHEM PHYS, V109, P2442, DOI 10.1063/1.476814
[4]   REACTIVE STICKING COEFFICIENTS FOR SILANE AND DISILANE ON POLYCRYSTALLINE SILICON [J].
BUSS, RJ ;
HO, P ;
BREILAND, WG ;
COLTRIN, ME .
JOURNAL OF APPLIED PHYSICS, 1988, 63 (08) :2808-2819
[5]   EFFECT OF TRANSLATIONAL AND VIBRATIONAL-ENERGY ON ADSORPTION - THE DYNAMICS OF MOLECULAR AND DISSOCIATIVE CHEMISORPTION [J].
CEYER, ST ;
BECKERLE, JD ;
LEE, MB ;
TANG, SL ;
YANG, QY ;
HINES, MA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04) :501-507
[6]   NEW MECHANISMS FOR CHEMISTRY AT SURFACES [J].
CEYER, ST .
SCIENCE, 1990, 249 (4965) :133-139
[7]   CHEMICAL VAPOR-DEPOSITION OF EPITAXIAL SILICON FROM SILANE AT LOW-TEMPERATURES .1. VERY LOW-PRESSURE DEPOSITION [J].
COMFORT, JH ;
REIF, R .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1989, 136 (08) :2386-2398
[8]  
*CRAY RES INC, 1995, UNICH US GUID
[9]   GAS-PHASE AND COMPUTATIONAL STUDIES OF PENTACOORDINATE SILICON [J].
DAMRAUER, R ;
BURGGRAF, LW ;
DAVIS, LP ;
GORDON, MS .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1988, 110 (20) :6601-6606
[10]   MECHANISTIC INSIGHT INTO GAS-PHASE REACTIONS OF H.+SI2H6 AND HYDROGEN-ATOM ETCHING OF SILICON SURFACES [J].
DOBBS, KD ;
DOREN, DJ .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1993, 115 (09) :3731-3738