An Approach to Locate Parametric Faults in Nonlinear Analog Circuits

被引：37

作者：

Deng, Yong ^{[1
]}

Shi, Yibing ^{[1
]}

Zhang, Wei ^{[1
]}

机构：

[1] Univ Elect Sci & Technol China, Sch Automat Engn, Chengdu 611731, Peoples R China

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2012年 / 61卷 / 02期

关键词：

Coherence function; fault diagnosis; nonlinear circuits; parametric faults; Volterra series; IDENTIFICATION; SYSTEMS; DIAGNOSIS; TIME;

D O I：

10.1109/TIM.2011.2161930

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Aiming at the problem to locate parametric faults in nonlinear analog circuits, a new approach based on the subband decomposition combined with coherence functions is proposed. First, the Volterra series of the circuit under test decomposed by wavelet packets are used to detect the parametric faults. Then, the Volterra series in subbands are used to calculate the coherence functions. By comparison with the fault signatures, different states of the parametric faulty circuits are identified, and the faults are located. Simulations show the effectiveness of the method of the fault diagnosis in nonlinear circuits.

引用

页码：358 / 367

页数：10

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