Optical characterization of pyrolytically deposited ZnxCd1-xS thin films

被引:12
作者
Eleruja, MA [1 ]
Adedeji, AV
Ojo, IAO
Djebah, A
Osasona, O
Aladekomo, JB
Ajayi, EOB
机构
[1] Obafemi Awolowo Univ, Dept Phys, Ile Ife, Nigeria
[2] Obafemi Awolowo Univ, Dept Chem, Ile Ife, Nigeria
[3] Obafemi Awolowo Univ, Dept Elect & Elect Engn, Ile Ife, Nigeria
关键词
optical characterization; photoluminescence spectra; ZnxCd1-xS thin films;
D O I
10.1016/S0925-3467(97)00178-X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The precursor bis-(morpholinodithioato-s,s')-Cd-Zn was prepared and the thin films of ZnxCd1 - xS deposited on sodalime glass substrate. A direct optical energy gap of 2.63 eV was obtained from the analysis of the absorption spectrum. The photoluminescence spectrum shows shift in the energy of the primary emission peaks as a function of the excitation energy. The shift was explained as due to the quantum size effect in nanometer thick polycrystalline films. Energy Dispersive X-ray Florescence (EDXRF) confirms the elemental composition of both the precursor and the films. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:257 / 263
页数:7
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