Lattice defect investigation of ECAP-Cu by means of X-ray line profile analysis, calorimetry and electrical resistometry

被引：149

作者：

Schafler, E ^{[1
]}

Steiner, G ^{[1
]}

Korznikova, E ^{[1
]}

Kerber, M ^{[1
]}

Zehetbauer, MJ ^{[1
]}

机构：

[1] Univ Vienna, Inst Mat Phys, A-1090 Vienna, Austria

来源：

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2005年 / 410卷 / 410-411期

基金：

奥地利科学基金会;

关键词：

nanostructures; severe plastic deformation; lattice defect annealing; deformation induced vacancies;

D O I：

10.1016/j.msea.2005.08.070

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Cu rods have been deformed by equal channel angular pressing (ECAP) up to shear strains gamma approximate to 5 while applying various deformation paths A, B-C and C. X-ray Bragg profile analyses (XPA), differential scanning calorimetry (DSC) as well as residual electrical resistivity (RER) measurements have been performed, in order to detect the densities of various deformation induced lattice defects and/or their arrangements. The results have been analysed in terms of annealing of deformation induced dislocations and vacancies (vacancy agglomerates). Compared to conventional cold work procedures, deformation by ECAP achieves a strongly enhanced concentration of vacancy type defects. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：169 / 173

页数：5

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