Measurement of transient deformations with dual-pulse addition electronic speckle-pattern interferometry

被引:34
作者
Farrant, DI [1 ]
Kaufmann, GH
Petzing, JN
Tyrer, JR
Oreb, BF
Kerr, D
机构
[1] CSIRO, Div Telecommun & Ind Phys, Lindfield, NSW 2070, Australia
[2] Univ Nacl Rosario, Fac Ciencias Exactas Ingn & Agrimensura, Dept Fis, RA-2000 Rosario, Santa Fe, Argentina
[3] Loughborough Univ Technol, Dept Mech Engn, Loughborough LE11 3TU, Leics, England
[4] Univ Nacl Rosario, Inst Fis Rosario, RA-2000 Rosario, Santa Fe, Argentina
来源
APPLIED OPTICS | 1998年 / 37卷 / 31期
关键词
D O I
10.1364/AO.37.007259
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We describe an electronic speckle-pattern interferometry system for analyzing addition fringes generated by the transient deformation of a test object. The system is based on a frequency-doubled twin Nd:YAG laser emitting dual pulses at a TV camera field rate (50 Hz). The main advance has been the automatic, quantitative analysis of dual-pulse addition electronic speckle-pattern interferometry data by the introduction of carrier fringes and the application of Fourier methods. The carrier fringes are introduced between dual pulses by a rotating mirror that tilts the reference beam. The resulting deformation-modulated addition fringes are enhanced with a deviation filter, giving fringe visibility close to that of subtraction fringes. The phase distribution is evaluated with a Fourier-transform method with bandpass filtering. From the wrapped phase distribution, a continuous phase map is reconstructed with an iterative weighted least-squares unwrapper. Preliminary results for a thin plate excited by an acoustic shock show the suitability of the system for the quantitative evaluation of transient deformation fields. (C) 1998 Optical Society of America OCIS codes: 120.3940, 120.6160, 100.5070, 070.2590.
引用
收藏
页码:7259 / 7267
页数:9
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