Surface plasmon resonance spectroscopy: prospects of superstrate refractive index variation for separate extraction of molecular layer parameters

被引：42

作者：

Beketov, GV ^{[1
]}

Shirshov, YM ^{[1
]}

Shynkarenko, OV ^{[1
]}

Chegel, VI ^{[1
]}

机构：

[1] NASU, Inst Semicond Phys, UA-252650 Kiev, Ukraine

来源：

SENSORS AND ACTUATORS B-CHEMICAL | 1998年 / 48卷 / 1-3期

关键词：

immunosensor; surface plasmon resonance; optical constants;

D O I：

10.1016/S0925-4005(98)00081-1

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A computational procedure for separate determination of n and d of thin transparent layers using the surface plasmon resonance (SPR) spectroscopy with variation of the refractive index of the solution and its application to immunic reaction studies are presented. This procedure is essentially based on a direct fitting of a set of the resonant curves. Effect of the experimental conditions and measurement errors on the accuracy of the data obtained has been analyzed. Precise measurement of the angle of incidence and the refractive index of the solution were found to be important for the correct determination of the layer parameters. This technique was applied to a mouse IgG and an anti-mouse IgG interaction study. It has been demonstrated that n and d of the molecular layer can be determined with reasonable accuracy even using relatively small variation of the refractive index of the solution. (C) 1998 Elsevier Science S.A. All rights reserved.

引用

页码：432 / 438

页数：7