FTIR images

被引:51
作者
Koenig, JL
Wang, SQ
Bhargava, R
机构
[1] Case Western Reserve Univ, Dept Macromol Sci, Cleveland, OH 44106 USA
[2] Univ Akron, Akron, OH 44325 USA
[3] NIDDK, Chem Phys Lab, NIH, Bethesda, MD 20892 USA
关键词
D O I
10.1021/ac012471p
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:360A / 369A
页数:10
相关论文
共 29 条
[1]   PAINT SAMPLE PRESENTATION FOR FOURIER-TRANSFORM INFRARED MICROSCOPY [J].
ALLEN, TJ .
VIBRATIONAL SPECTROSCOPY, 1992, 3 (03) :217-237
[2]  
[Anonymous], 1980, ANAL CHEM, V52, P2242
[3]   Effect of focal plane array cold shield aperture size on fourier transform infrared micro-imaging spectrometer performance [J].
Bhargava, R ;
Fernandez, DC ;
Schaeberle, MD ;
Levin, IW .
APPLIED SPECTROSCOPY, 2000, 54 (12) :1743-1750
[4]   FTIR imaging studies of a new two-step process to produce polymer dispersed liquid crystals [J].
Bhargava, R ;
Wang, SQ ;
Koenig, JL .
MACROMOLECULES, 1999, 32 (08) :2748-2760
[5]   FT-IR imaging of the interface in multicomponent systems using optical effects induced by differences in refractive index [J].
Bhargava, R ;
Wang, SQ ;
Koenig, JL .
APPLIED SPECTROSCOPY, 1998, 52 (03) :323-328
[6]   Comparison of the FT-IR mapping and imaging techniques applied to polymeric systems [J].
Bhargava, R ;
Wall, BG ;
Koenig, JL .
APPLIED SPECTROSCOPY, 2000, 54 (04) :470-479
[7]   Fourier transform infrared microscopy: some advances in techniques for characterisation and structure-property elucidations of industrial material [J].
Chalmers, JM ;
Everall, NJ ;
Hewitson, K ;
Chesters, MA ;
Pearson, M ;
Grady, A ;
Ruzicka, B .
ANALYST, 1998, 123 (04) :579-586
[8]   Infrared spectroscopic imaging: From planetary to cellular systems [J].
Colarusso, P ;
Kidder, LH ;
Levin, IW ;
Fraser, JC ;
Arens, JF ;
Lewis, EN .
APPLIED SPECTROSCOPY, 1998, 52 (03) :106A-120A
[9]  
Crocombe R. A., 1997, MICROSCOPY MICROA S2, V3, P863
[10]   Uncooled barium strontium titanium focal plane array detection for mid-infrared Fourier transform spectroscopic imaging [J].
Haka, AS ;
Levin, IW ;
Lewis, EN .
APPLIED SPECTROSCOPY, 2000, 54 (05) :753-755