Integral method for echelles covered with lossless or absorbing thin dielectric layers

被引：24

作者：

Popov, E

Bozhkov, B

Maystre, D

Hoose, J

机构：

[1] Inst Solid State Phys, BU-1784 Sofia, Bulgaria

[2] Fac Sci & Tech St Jerome, Lab Opt Electromagnet, F-13397 Marseille 20, France

[3] Spectron Instruments Inc, Rochester, NY 14625 USA

来源：

APPLIED OPTICS | 1999年 / 38卷 / 01期

关键词：

D O I：

10.1364/AO.38.000047

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We make a generalization of the integral method in the electromagnetic theory of gratings to study diffraction by echelles covered with dielectric lossless or absorbing layers. Numerical examples are given that show that, as in the resonance domain, the diffraction efficiency is more complicated than being a simple product of lossless diffraction efficiency curves and plane surface reflectivity. (C) 1999 Optical Society of America.

引用

页码：47 / 55

页数：9

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