Crossover between fractal and nonfractal flux penetration in high-temperature superconducting thin films

被引：29

作者：

Surdeanu, R

Wijngaarden, RJ

Dam, B

Rector, J

Griessen, R

Rossel, C

Ren, ZF

Wang, JH

机构：

[1] Free Univ Amsterdam, Inst COMPAS, NL-1081 HV Amsterdam, Netherlands

[2] Free Univ Amsterdam, Fac Phys & Astron, NL-1081 HV Amsterdam, Netherlands

[3] IBM Corp, Div Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland

[4] SUNY Buffalo, Dept Chem, Superconduct Mat Lab, Buffalo, NY 14260 USA

[5] SUNY Buffalo, New York State Inst Superconduct, Buffalo, NY 14260 USA

来源：

PHYSICAL REVIEW B | 1998年 / 58卷 / 18期

关键词：

D O I：

10.1103/PhysRevB.58.12467

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this study the role of anisotropy on flux penetration in c-axis epitaxial Tl2Ba2CuO6+x and YBa2Cu3O7-x films is investigated by magneto-optics. We study thin films of Tl2Ba2CuO6+x on substrates with vicinal angles of 0 degrees (well-oriented), 0.5 degrees, 2.5 degrees, and 4 degrees and YBa2Cu3O7-x films as a function of chain-conduction-induced anisotropy. A crossover from fractal to nonfractal flux penetration is observed with increasing anisotropy. Numerical simulations of anisotropic flux motion are compared with experiment. [S0163-1829(98)05742-7].

引用

页码：12467 / 12477

页数：11

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