共 44 条
[1]
NEW SCANNING TUNNELING MICROSCOPY TIP FOR MEASURING SURFACE-TOPOGRAPHY
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1990, 8 (01)
:429-433
[2]
Atomic force microscopy study of electron beam written contamination structures
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1996, 14 (01)
:54-62