Degradation processes at the cathode/organic interface in organic light emitting devices with Mg:Ag cathodes

被引：188

作者：

Aziz, H ^{[1
]}

Popovic, Z

Tripp, CP

Hu, NX

Hor, AM

Xu, G

机构：

[1] McMaster Univ, Dept Mat Sci & Engn, Hamilton, ON L8S 4L7, Canada

[2] Xerox Res Ctr Canada Ltd, Mississauga, ON L5K 2L1, Canada

来源：

APPLIED PHYSICS LETTERS | 1998年 / 72卷 / 21期

关键词：

D O I：

10.1063/1.121442

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report electroluminescence degradation studies on tris(8-hydroxyquinoline) aluminum (Alq(3))-based organic light emitting devices (OLEDs) with Mg:Ag cathodes in ambient conditions. The nonemissive spots in the OLEDs are studied via optical and fluorescence microscopy and via microscopic infrared spectroscopy. Studies reveal that a majority of the nonemissive spots are caused by the growth of Mg(OH)(2), sites at the Alq(3)/Mg:Ag interface, associated with local degradation of the Alq3 layer. In addition, the growth of elevated cathode bubbles, which also lead to nonemissive spots, is found to be caused by gas evolution from the galvanic corrosion of the Mg/Ag couple as well as from the electrolysis of absorbed moisture. (C) 1998 American Institute of Physics.

引用

页码：2642 / 2644

页数：3

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