Thermal analysis and design of GaN-based LEDs for high power applications

被引:13
作者
Kim, L [1 ]
Lee, GW [1 ]
Hwang, WJ [1 ]
Yang, JS [1 ]
Shin, MW [1 ]
机构
[1] Myong Ji Univ, Dept Ceram Engn, Semicond Mat Devices Lab, Kyunggi 449728, South Korea
来源
5TH INTERNATIONAL CONFERENCE ON NITRIDE SEMICONDUCTORS (ICNS-5), PROCEEDINGS | 2003年 / 0卷 / 07期
关键词
D O I
10.1002/pssc.200303466
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
In this paper, a thermal analysis was made on blue and white GaN-based LEDs. The thermal analysis consists of experimental temperature measurements and finite element calculations on the LED chips and surface of epoxy package. The direct on-chip temperature measurement using a nematic liquid crystal resulted in a hot spot with a transition boundary of 43 degreesC in a range of about 450 to 500 mum under a forward voltage of 3.9 V. The surface temperature of the epoxy package was measured as a function of input power and it exhibits a linear relationship. The finite element method was used for the calculation of temperature distributions for samples and the simulated data showed good agreement with the experimental results. (C) 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码:2261 / 2264
页数:4
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