Thin photodiodes for a neutron scintillator silicon-well detector

被引:13
作者
Allier, CP
Hollander, RW
van Eijk, CWE
Sarro, PM
de Boer, M
Czirr, JB
Chaminade, JP
Fouassier, C
机构
[1] Delft Univ Technol, Interfac Reactor Inst, Radiat Technol Grp, NL-2629 JB Delft, Netherlands
[2] Delft Univ Technol, Delft Inst Microelect & Submicron Technol, NL-2600 AA Delft, Netherlands
[3] Univ Twente, Inst Res, MESA, NL-7500 AE Enschede, Netherlands
[4] Photogen, Salt Lake City, UT 84047 USA
[5] Inst Chim Mat Condensee Bordeaux, F-33608 Pessac, France
关键词
micromachining; neutron detectors; photodiodes; position-sensitive particle detectors; silicon-on-insulator technology;
D O I
10.1109/23.958741
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In the development of new neutron imaging applications, it is crucial to achieve a detector combining high spatial resolution, fast response, and high detection efficiency. To achieve such features, we have proposed a new design for position sensitive radiation sensors, which we called the micromachined Si-well scintillator pixel detector. It consists of an array of scintillator crystals encapsulated in silicon wells with photodiodes at the bottom. In the following, we describe such a detector, which makes use of a powder of Li-6(6)158 Gd(BO3)(3)(Ce3+). The first experiments obtained with a prototype detector using a thermal neutron beam show the presence of a signal above the detector noise tail. In addition, to improve the characteristics of the well-type silicon sensor, we have investigated the deep reactive ion etching on silicon-on-insulator wafers. The process to etch 700-mum-wide vertical wells into a 500-mum-thick silicon wafer has been optimized. Test detectors with 10-mum-thick photodiodes at the bottom have been fabricated by means of this process.
引用
收藏
页码:1154 / 1157
页数:4
相关论文
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