X-ray Diffraction Patterns of Thermally-reduced Graphenes

被引：121

作者：

Ju, Hae-Mi ^{[1
]}

Choi, Sung-Ho ^{[1
]}

Huh, Seung Hun ^{[1
]}

机构：

[1] KICET, Nanotechnol Convergence Lab, Seoul 153801, South Korea

来源：

JOURNAL OF THE KOREAN PHYSICAL SOCIETY | 2010年 / 57卷 / 06期

关键词：

Thermal reduction; Graphene; Graphene oxide; XRD; GRAPHITE OXIDE; REDUCTION;

D O I：

10.3938/jkps.57.1649

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Thermally-reduced graphenes (GPs) from graphene oxides (GOs) in the range of 200 - 800 degrees C have been investigated by using X-ray diffraction (XRD). The temperature-dependent evolutions of the (002) peaks show that exfoliation of GO sheets occurs, along with wrinkling, at similar to 200 degrees C and that high-quality GPs are produced at similar to 600 degrees C (GP(600)). These phenomena are explained by the vaporization of intercalated water molecules and the effective removal of the oxide groups of GO by thermal annealing, respectively. GP(600) exhibited a clean and sharp (002) peak corresponding to an interlayer distance of 3.392 angstrom, which is close to that of conventional graphene (similar to 3.4 angstrom). The structure of GP(600) is further discussed.

引用

页码：1649 / 1652

页数：4

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