Origin of hysteresis in a proximity Josephson junction

被引：211

作者：

Courtois, H. ^{[1
,2
,3
]}

Meschke, M. ^{[1
]}

Peltonen, J. T. ^{[1
]}

Pekola, J. P. ^{[1
]}

机构：

[1] Helsinki Univ Technol, Low Temp Lab, Helsinki 02015, Finland

[2] CNRS, Inst Neel, F-38042 Grenoble, France

[3] Univ Grenoble 1, F-38042 Grenoble, France

来源：

PHYSICAL REVIEW LETTERS | 2008年 / 101卷 / 06期

关键词：

D O I：

10.1103/PhysRevLett.101.067002

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We investigate hysteresis in the transport properties of superconductor-normal-metal-superconductor (S-N-S) junctions at low temperatures by measuring directly the electron temperature in the normal metal. Our results demonstrate unambiguously that the hysteresis results from an increase of the normal-metal electron temperature once the junction switches to the resistive state. In our geometry, the electron temperature increase is governed by the thermal resistance of the superconducting electrodes of the junction.

引用

页数：4

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