Propagation loss measurements in semiconductor microcavity ring and disk resonators

被引:58
作者
Rafizadeh, D
Zhang, JP
Tiberio, RC
Ho, ST
机构
[1] Northwestern Univ, McCormick Sch Engn, Dept Elect & Comp Engn, Evanston, IL 60208 USA
[2] Cornell Univ, Cornell Nanofabricat Facil, Ithaca, NY 14853 USA
基金
美国国家科学基金会;
关键词
integrated optics; loss measurement; microresonators; optical device fabrication; optical filters; optical waveguides;
D O I
10.1109/50.701410
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report the measurement of cavity propagation losses in nearly Single-mode semiconductor waveguide-coupled ring and disk microcavity optical resonators. Using a novel 10.5-mu m-diameter ring resonator, we measure transverse electric (TE) and transverse magnetic (TM) field intensity losses in 0.35-mu m-wide ring waveguide cavities in the 1.55-mu m-wavelength region. We present the experimental results for nanofabricated AlGaAs/GaAs 10.5-mu m-diameter ring and disk resonators to quantify cavity losses and to show the feasibility of these promising and robust submicron-scale devices.
引用
收藏
页码:1308 / 1314
页数:7
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