Waveguide study and refractive indices of GaN:Mg epitaxial film

被引：19

作者：

Zhang, HY ^{[1
]}

He, XH ^{[1
]}

Shih, YH ^{[1
]}

Schurman, M ^{[1
]}

Feng, ZC ^{[1
]}

Stall, RA ^{[1
]}

机构：

[1] EMCORE CORP,SOMERSET,NJ 08873

来源：

OPTICS LETTERS | 1996年 / 21卷 / 19期

关键词：

D O I：

10.1364/OL.21.001529

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Waveguide TE and TM modes in a GaN:Mg epitaxial crystalline film were studied in a wide spectral range (457.9-1053 nm). The refractive indices n(e) and n(o) were accurately determined by TM and TE mode measurements at six different wavelengths (457.9, 514.5, 632.8, 724.3, 855.1, and 1053 nm). Dispersive curves of n(e) versus lambda and n(o) versus lambda were obtained. It was found that bireferingence slightly increases (n(e) - n(o) = 0.933-0.038) from 1053 to 457.9 nm. (C) 1996 Optical Society of America

引用

页码：1529 / 1531

页数：3

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