Dielectric breakdown model for conductor-loaded and insulator-loaded composite materials

被引:25
作者
Bergero, P
Peruani, F
Solovey, G
Irurzun, IM
Vicente, JL
Mola, EE
机构
[1] Natl Univ La Plata, INIFTA, CONICET, CICPBA, RA-1900 La Plata, Argentina
[2] Univ Buenos Aires, Fac Ciencias Exactas & Nat, Dept Fis, RA-1428 Buenos Aires, DF, Argentina
来源
PHYSICAL REVIEW E | 2004年 / 69卷 / 01期
关键词
D O I
10.1103/PhysRevE.69.016123
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
In the present work we generalize the dielectric breakdown model to describe dielectric breakdown patterns in both conductor-loaded and insulator-loaded composites. The present model is an extension of a previous one [F. Peruani , Phys. Rev. E 67, 066121 (2003)] presented by the authors to describe dielectric breakdown patterns in conductor-loaded composites. Particles are distributed at random in a matrix with a variable concentration p. The generalized model assigns different probabilities P(i,k-->i('),k(')) to breakdown channel formation according to particle characteristics. Dielectric breakdown patterns are characterized by their fractal dimension D and the parameters of the Weibull distribution. Studies are carried out as a function of the fraction of inhomogeneities, p.
引用
收藏
页数:6
相关论文
共 21 条
[1]   CROSSOVER SCALING FROM MULTIFRACTAL THEORY - DIELECTRIC-BREAKDOWN WITH CUTOFFS [J].
ARIAN, E ;
ALSTROM, P ;
AHARONY, A ;
STANLEY, HE .
PHYSICAL REVIEW LETTERS, 1989, 63 (19) :2005-2009
[2]   STOCHASTIC MODELING OF ELECTRICAL TREEING - FRACTAL AND STATISTICAL CHARACTERISTICS [J].
BARCLAY, AL ;
SWEENEY, PJ ;
DISSADO, LA ;
STEVENS, GC .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1990, 23 (12) :1536-1545
[3]  
Chawla K.K., 1998, COMPOSITE MAT SCI EN
[4]   THE INFLUENCE OF PHYSICAL-PROPERTIES ON ELECTRICAL TREEING IN A CROSS-LINKED SYNTHETIC RESIN [J].
COOPER, JM ;
STEVENS, GC .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1990, 23 (12) :1528-1535
[5]   PHYSICAL MODEL FOR BREAKDOWN STRUCTURES IN SOLID DIELECTRICS [J].
DISSADO, LA ;
SWEENEY, PJJ .
PHYSICAL REVIEW B, 1993, 48 (22) :16261-16268
[6]  
DISSADO LA, 2000, J PHYS D, V33, pL1
[7]  
DISSADO LA, 2000, J PHYS D, V33, pL99
[8]  
Gul V. E., 1996, STRUCTURE PROPERTIES
[9]   Fractal analysis of electrical trees in a cross-linked synthetic resin [J].
Irurzun, IM ;
Vicente, JL ;
Cordero, MC ;
Mola, EE .
PHYSICAL REVIEW E, 2001, 63 (01)
[10]   Dielectric breakdown in solids modeled by DBM and DLA [J].
Irurzun, IM ;
Bergero, P ;
Mola, V ;
Cordero, MC ;
Vicente, JL ;
Mola, EE .
CHAOS SOLITONS & FRACTALS, 2002, 13 (06) :1333-1343