X-ray magnetic microscopy for correlations between magnetic domains and crystal structure

被引：1

作者：

Denbeaux, G

Anderson, E

Bates, B

Chao, W

Liddle, JA

Harteneck, B

Pearson, A

Salmassi, F

Schneider, G

Fischer, P

Eimüller, T

Taylor, S

Chang, H

Kusinski, GJ

机构：

[1] Lawrence Berkeley Natl Lab, Ctr Xray Opt, Berkeley, CA 94720 USA

[2] Max Planck Inst Met Res, D-70569 Stuttgart, Germany

[3] Lawrence Berkeley Natl Lab, Div Sci Mat, Berkeley, CA 94720 USA

[4] MMFX Technol, Irvine, CA USA

来源：

JOURNAL DE PHYSIQUE IV | 2003年 / 104卷

关键词：

D O I：

10.1051/jp4:20030126

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Accurately determining the resolution of x-ray microscopes has been a challenge because good test patterns for x-ray microscopy have been hard to make. We report on a sputter-deposited multilayer imaged in cross section as a test pattern with small features and high aspect ratios. One application of high-resolution imaging is magnetic materials. Off-axis bend magnet radiation is known to have a component of circular polarization which can be used for x-ray magnetic circular dichroism. We calculate the integrated circular polarization collected by the illumination optics in the XM-1 full-field x-ray microscope.

引用

页码：477 / 481

页数：5

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