A new device for the study of electron-ion interactions

被引：6

作者：

Currell, FJ ^{[1
]}

Aiken, J

Dunn, KF

Lu, X

McCullough, RW

Sokell, EJ

O'Rourke, BE

Krastev, V

Watanabe, H

机构：

[1] Queens Univ Belfast, Dept Phys, Belfast BT7 1NN, Antrim, North Ireland

[2] Univ Coll Dublin, Dept Expt Phys, Dublin 4, Ireland

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2003年 / 205卷

关键词：

electron impact ion trap; EBIT; electron-ion interactions;

D O I：

10.1016/S0168-583X(02)02036-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The conceptual design of a new electron beam ion trap primarily intended for the study of electron-ion interactions is outlined along with some preliminary predictions regarding its capabilities. (C) 2003 Elsevier Science B.V. All rights reserved.

引用

页码：230 / 233

页数：4

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