Compact electron-beam ion trap using NdFeB permanent magnets

被引：35

作者：

Motohashi, K ^{[1
]}

Moriya, A ^{[1
]}

Yamada, H ^{[1
]}

Tsurubuchi, S ^{[1
]}

机构：

[1] Tokyo Univ Agr & Technol, Dept Appl Phys, Tokyo 1848588, Japan

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2000年 / 71卷 / 02期

关键词：

D O I：

10.1063/1.1150323

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A compact electron-beam ion trap (EBIT) as a multiply charged ion source for medium Z, e.g., Ne10+, Ar18+, Kr26+, and so on, has been developed. A pair of NdFeB permanent magnets generates an intense magnetic field (0.64 T) along with the electron-beam axis. The maximum electron-beam energy and current were designed as 10 keV and 30 mA, respectively. Over 95% of the electron beam up to 20 mA was transmitted to an electron collector. All parts, including electrical feedthroughs, are mounted on a con-flat flange with an 8 in. diam. Portability is added to the EBIT because no cooling system for the electromagnet is needed. Hydrogen-like Ar17+ were extracted. (C) 2000 American Institute of Physics. [S0034-6748(00)60202-2].

引用

页码：890 / 892

页数：3

共 6 条

[1] STRUCTURE AND LAMB SHIFT OF 2S(1/2)-2P(3/2) LEVELS IN LITHIUM-LIKE U89+ THROUGH NEON-LIKE U82+ [J].