Artifacts induced in metallic glasses during TEM sample preparation

被引：58

作者：

Sun, BB

Wang, YB

Wen, J

Yang, H

Sui, ML ^{[1
]}

Wang, JQ

Ma, E

机构：

[1] Johns Hopkins Univ, Dept Mat Sci & Engn, Baltimore, MD 21218 USA

[2] Chinese Acad Sci, Met Res Inst, SYNL, Shenyang 110016, Peoples R China

来源：

SCRIPTA MATERIALIA | 2005年 / 53卷 / 07期

基金：

中国国家自然科学基金;

关键词：

metallic glass; TEM sample preparation; HRTEM; HAADF;

D O I：

10.1016/j.scriptamat.2005.06.007

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The objective of this study is to demonstrate the various artificial features introduced into metallic amorphous alloys by improper TEM sample preparation. Such artifacts are often confused with the intrinsic microstructures when examining metallic glasses under TEM. The electropolishing and ion milling procedures are compared in terms of their merits/drawbacks for avoiding/inducing artifacts in metallic glass samples. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

收藏

页码：805 / 809

页数：5

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