Fabrication of intrinsic microcrystalline silicon thin films used for solar cells and its structure

被引:10
作者
Zhang, XD [1 ]
Zhao, Y
Gao, YT
Zhu, F
Wei, CC
Sun, J
Geng, XH
Xiong, SZ
机构
[1] Nankai Univ, Ins Photoelect Thin Films Devices & Tech, Tianjin 300071, Peoples R China
[2] Key Lab Photoelect Thin Films Devices & Tech Tian, Tianjin 300071, Peoples R China
[3] Nankai Univ, Minist Educ, Key Lab Optoelect Informat Sci & Technol, Tianjin 300071, Peoples R China
关键词
intrinsic microcrystalline silicon thin film; Raman spectra; x-ray diffraction;
D O I
10.7498/aps.54.4874
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Microcrystalline silicon thin films used for solar cells were, deposited at different silane concentrations and reaction pressures by VHF-PECVD. Study of materials structure was conducted by Raman spectra and x-ray diffraction. In tire range of experiment, microcrystalline silicon thin films prepared under different conditions all have ( 220) preferential orientation. Microcrystalline silicon solar cells with conversion efficiency up to 7. 1 % were fabricated. The structure of solar cells was glass/ZnO/p(mu c-Si; H)/ i(mu c-Si: H)/n(a-Si: H/Al). There was no Zno back reflector and the thickness of solar cells was only 1.2 mu m.
引用
收藏
页码:4874 / 4878
页数:5
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