Single grain analysis of dislocation density in cold rolled IF-Ti steel with a new high-resolution microdiffraction technique

被引:6
作者
Castelnau, O
Chauveau, T
Drakopoulos, M
Snigirev, A
Snigireva, I
Schroer, C
Ungár, T
机构
[1] Univ Paris 13, CNRS, LPMTM, FR-93430 Villetaneuse, France
[2] ESRF European Synchroton Radiat Facil, FR-38043 Grenoble, France
[3] Rhein Westfal TH Aachen, Inst Phys 2, DE-52056 Aachen, Germany
[4] Eotvos Lorand Univ, Inst Gen Phys, HU-1445 Budapest, Hungary
来源
ECRS 5: PROCEEDINGS OF THE FIFTH EUROPEAN CONFERENCE ON RESIDUAL STRESSES | 2000年 / 347-3卷
关键词
dislocations; line profile analysis; microdiffraction; plasticity;
D O I
10.4028/www.scientific.net/MSF.347-349.297
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A new set-up for X-ray microdiffraction has been developed on the ESRF beamline ID22. This set-up allows very local characterisations of materials, the size of the focussed beam being only of a few microns and the position of the beam on the specimen being determined with an accuracy of about 30 microns. Data such as average size of the coherently diffracting volume, local dislocation density, residual stresses, local fluctuation of the residual stresses, intragranular misorientation, can be obtained from the X-ray intensity distribution on a 2-D detector. The first application on an IF-Ti steel after different thermomechanical treatments (recrystallization, cold-rolling, annealing) is presented.
引用
收藏
页码:297 / 302
页数:6
相关论文
共 13 条
[1]  
BORBELY A, IN PRESS MAT SCI ENG
[2]  
CASTELNAU O, IN PRESS MAT SCI FOR
[3]  
Humphreys F.J., 2017, Recrystallization and Related Annealing Phenomena
[5]  
LENGELER B, UNPUB J APPL PHYS
[6]  
MIROUX A, 1999, THESIS U PARIS N
[7]   Neutron diffraction method for stored energy measurement in interstitial free steel [J].
Rajmohan, N ;
Hayakawa, Y ;
Szpunar, JA ;
Root, JH .
ACTA MATERIALIA, 1997, 45 (06) :2485-2494
[8]   ASYMMETRIC X-RAY-LINE BROADENING OF PLASTICALLY DEFORMED-CRYSTALS .2. EVALUATION PROCEDURE AND APPLICATION TO [001]-CU CRYSTALS [J].
UNGAR, T ;
GROMA, I ;
WILKENS, M .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1989, 22 :26-34
[9]   The effect of dislocation contrast on x-ray line broadening: A new approach to line profile analysis [J].
Ungar, T ;
Borbely, A .
APPLIED PHYSICS LETTERS, 1996, 69 (21) :3173-3175
[10]  
Ungár T, 1999, PHYS STATUS SOLIDI A, V171, P425, DOI 10.1002/(SICI)1521-396X(199902)171:2<425::AID-PSSA425>3.0.CO