Frequency modulation detection atomic force microscopy in the liquid environment

被引：22

作者：

Jarvis, S. P. ^{[1
]}

Ishida, T. ^{[2
]}

Uchihashi, T. ^{[3
]}

Nakayama, Y. ^{[4
]}

Tokumoto, H. ^{[1
]}

机构：

[1] JRCAT NAIR, Tsukuba, Ibaraki 3050046, Japan

[2] PRESTO JST, Mech Engn Lab, Tsukuba, Ibaraki 3058564, Japan

[3] Himeji Inst Technol, Dept Elect, Himeji, Hyogo 6712201, Japan

[4] Univ Osaka Prefecture, Dept Phys Elect, Osaka 5998531, Japan

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2001年 / 72卷 / Suppl 1期

关键词：

PACS: 61.16.Ch; 61.25.Em; 68.45.Nj;

D O I：

10.1007/s003390100647

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

True atomic resolution imaging using frequency modulation detection is already well established in ultra-high vacuum. In this paper we demonstrate that it also has great potential in the liquid environment. Using a combination of magnetic activation and high-aspect-ratio carbon nanotube probes, we show that imaging can be readily combined with point spectroscopy, revealing both the tip-sample interaction and the structure of the intermediate liquid.

引用

页码：S129 / S132

页数：4

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