Element-selective single atom imaging

被引:259
作者
Suenaga, K
Tencé, M
Mory, C
Colliex, C
Kato, H
Okazaki, T
Shinohara, H
Hirahara, K
Bandow, S
Iijima, S
机构
[1] Univ Paris 11, Phys Solides Lab, CNRS, UMR 8502, F-91405 Orsay, France
[2] Univ Paris 11, Aime Cotton Lab, CNRS, UPR 3321, F-91405 Orsay, France
[3] Meijo Univ, Japan Sci & Technol Corp, Nanotubul Project, Nagoya, Aichi 4688502, Japan
[4] Nagoya Univ, Dept Chem, Nagoya, Aichi 4648602, Japan
[5] NEC Corp Ltd, Tsukuba, Ibaraki 3058501, Japan
关键词
D O I
10.1126/science.290.5500.2280
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Electron energy-loss spectroscopy (EELS) is widely used to identify elemental compositions of materials studied by microscopy. We demonstrate that the sensitivity and spatial resolution of EELS can be extended to the single-atom Limit. A chemical map for gadolinium (Cd) clearly reveals the distribution of Cd atoms inside a single chain of metallofullerene molecules (Gd@C-82) generated within a single-wall carbon nanotube, This characterization technique thus provides the "eyes" to see and identify individual atoms in nanostructures. It is likely to find broad application in nanoscale science and technology research.
引用
收藏
页码:2280 / +
页数:4
相关论文
共 9 条
  • [1] Colliex C, 1999, J ELECTRON MICROSC, V48, P995
  • [2] VISIBILITY OF SINGLE ATOMS
    CREWE, AV
    WALL, J
    LANGMORE, J
    [J]. SCIENCE, 1970, 168 (3937) : 1338 - &
  • [3] Egerton R. F, 1996, Electron Energy-Loss Spectroscopy in the Electron Microscope, P245
  • [4] HIRAHARA K, IN PRESS PHYS REV LE
  • [5] IIJIMA S, 1977, OPTIK, V47, P437
  • [6] MICROANALYSIS OF LIGHT-ELEMENTS USING TRANSMITTED ENERGY-LOSS ELECTRONS
    ISAACSON, M
    JOHNSON, D
    [J]. ULTRAMICROSCOPY, 1975, 1 (01) : 33 - 52
  • [7] EELS QUANTIFICATION NEAR THE SINGLE-ATOM DETECTION LEVEL
    KRIVANEK, OL
    MORY, C
    TENCE, M
    COLLIEX, C
    [J]. MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1991, 2 (2-3): : 257 - 267
  • [8] ELEMENTAL ANALYSIS NEAR THE SINGLE-ATOM DETECTION LEVEL BY PROCESSING SEQUENCES OF ENERGY-FILTERED IMAGES
    MORY, C
    COLLIEX, C
    [J]. ULTRAMICROSCOPY, 1989, 28 (1-4) : 339 - 346
  • [9] High-resolution electron microscopy of Gd@C-82 metal fullerenes grown on MgO(001) surfaces
    Tanaka, N
    Honda, Y
    Kawahara, M
    Kishida, M
    Shinohara, H
    [J]. THIN SOLID FILMS, 1996, 281 : 613 - 617