In-plane textured oxide buffer layer for the TFA-MOD method on ⟨100⟩{001} Ni tapes using MOD process

We developed a low cost process, the so-called all-MOD process, whereby we used MOD to deposit both YBCO and oxide buffer layers on {100}<001> Ni tapes. Highly in-plane textured and crack-free Ce-Gd-O (CGO) buffer layers on the cube-textured Ni tapes were achieved by the MOD process. Highly in-plane textured YBCO films on the CGO-buffered Ni tapes were also observed. Long tapes were made by applying a I in long CGO buffer layer on the Ni tapes and firing in a batch-type furnace. The CGO films were made by a continuous bead coating process and firing under an Ar-H-2 atmosphere. The 1 m CGO-on-Ni tape was highly in-plane textured. R-1(200) and FWHM of phi-scan values were 88-96% and 7.0-8.5degrees, respectively. We determined the degree of (n00)-orientation: R-1(n00) [equivalent to1((n00))/{I-(n00)+I-(mmm)} x 100(%)], where I-(n00) and peaks I-(mmm) represent the X-ray theta-2theta scan intensities. These results indicate that buffered Ni tapes made by the MOD process are useful for TFA-MOD fabrication of long-length YBCO coated conductors. (C) 2003 Elsevier B.V. All rights reserved.