LEEM basics

被引：85

作者：

Bauer, E ^{[1
]}

机构：

[1] Arizona State Univ, Dept Phys & Astron, Tempe, AZ 85287 USA

来源：

SURFACE REVIEW AND LETTERS | 1998年 / 5卷 / 06期

关键词：

D O I：

10.1142/S0218625X98001614

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The fundamental physical phenomena on which LEEM is based are discussed, with the goal of showing why LEEM works, not how it works. The subjects covered include intensity, resolution, contrast, sampling depth and combination possibilities with other techniques (particularly LEED) which make LEEM a unique surface imaging method.

引用

页码：1275 / 1286

页数：12

共 38 条

[11]

BAUER E, 1962, P 5 INT C EL MICR, pD11

[12]

BAUER E, 1975, INTERACTIONS METAL S, P225

[13]

CHMELIK J, 1989, OPTIK, V83, P155

[14] ELASTIC AND INELASTIC BACKSCATTERING OF SLOW-ELECTRONS FROM SILICON [J].

DIETZEL, W ;

MEISTER, G ;

BAUER, E .

ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1982, 47 (03) :189-194

[15]

Ehrenberg W, 1934, PHILOS MAG, V18, P878

[16] PHOTOEMISSION SPECTROSCOPY - CORRESPONDENCE BETWEEN QUANTUM-THEORY AND EXPERIMENTAL PHENOMENOLOGY [J].

FEIBELMAN, PJ ;

EASTMAN, DE .

PHYSICAL REVIEW B, 1974, 10 (12) :4932-4947

[17] COMPARISON OF BACKSCATTERING INTENSITIES FOR LOW-ENERGY ELECTRONS FROM VARIOUS SURFACE ATOMS (H,LI,BE,C,O,AL,SI,S,V,CR,NI,CU,AG,PT,AU) [J].

FINK, M ;

SOMORJAI, GA ;

MARTIN, MR .

SURFACE SCIENCE, 1972, 29 (01) :303-&

[18]

Fink M., 1970, Atomic Data, V1, P385

[19]

Fink M., 1972, Atomic Data, V4, P129, DOI 10.1016/S0092-640X(72)80003-2

[20] OXYGEN ON NICKEL [J].

GERMER, LH ;

HARTMAN, CD .

JOURNAL OF APPLIED PHYSICS, 1960, 31 (12) :2085-2095

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