Metastability of phosphorus- or boron doped a-Si:H films

被引:10
作者
St'ahel, P [1 ]
Cabarrocas, PRI [1 ]
Sladek, P [1 ]
Theye, ML [1 ]
机构
[1] Ecole Polytech, Phys Interfaces & Couches Minces Lab, UMR 7647, CNRS, F-91128 Palaiseau, France
来源
AMORPHOUS AND MICROCRYSTALLINE SILICON TECHNOLOGY-1998 | 1998年 / 507卷
关键词
D O I
10.1557/PROC-507-649
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The effects of light-soaking on either phosphorus- or boron-doped a-Si:H films were studied as functions of the doping level and the temperature. In the case of boron-doped films, the most important effect is the improvement of the conductivity during light-soaking, which is related to the activation of boron. On the contrary, phosphorus-doped films present a remarkable stability, although lightly phosphorus-doped ones show a decrease of their conductivity by five orders of magnitude when light-soaking is performed below 40 degrees C. This effect is attributed to the formation of P-H complexes which are stable at low temperature only. Our results suggest that in both types of doped a-Si:H films the creation of metastable defects is a second order effect with respect to the activation or passivation of dopants, which results from their interaction with hydrogen.
引用
收藏
页码:649 / 654
页数:6
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