Fabrication of microprobe array with sub-100nm nano-heater for nanometric thermal imaging and data storage
被引:22
作者:
Lee, DW
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机构:
Tohoku Univ, Fac Engn, Venture Business Lab, Aoba Ku, Sendai, Miyagi 9808579, JapanTohoku Univ, Fac Engn, Venture Business Lab, Aoba Ku, Sendai, Miyagi 9808579, Japan
Lee, DW
[1
]
Ono, T
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机构:
Tohoku Univ, Fac Engn, Venture Business Lab, Aoba Ku, Sendai, Miyagi 9808579, JapanTohoku Univ, Fac Engn, Venture Business Lab, Aoba Ku, Sendai, Miyagi 9808579, Japan
Ono, T
[1
]
Abe, T
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机构:
Tohoku Univ, Fac Engn, Venture Business Lab, Aoba Ku, Sendai, Miyagi 9808579, JapanTohoku Univ, Fac Engn, Venture Business Lab, Aoba Ku, Sendai, Miyagi 9808579, Japan
Abe, T
[1
]
Esashi, M
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机构:
Tohoku Univ, Fac Engn, Venture Business Lab, Aoba Ku, Sendai, Miyagi 9808579, JapanTohoku Univ, Fac Engn, Venture Business Lab, Aoba Ku, Sendai, Miyagi 9808579, Japan
Esashi, M
[1
]
机构:
[1] Tohoku Univ, Fac Engn, Venture Business Lab, Aoba Ku, Sendai, Miyagi 9808579, Japan
来源:
14TH IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, TECHNICAL DIGEST
|
2001年
关键词:
D O I:
10.1109/MEMSYS.2001.906514
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
A novel fabrication method of a micro-thermal probe and its array for nanometric thermal imaging and a technological approach for probe-based data storage are presented. A small metal wire fora nano-heater is fabricated at the apex of a pyramidal SiO2 tip, which is formed by low temperature oxidation of a silicon etch-pit at 950 degreesC, consecutive metal deposition (Pt/Cr or Au/Cr) to fill the metal into the etch-pit, and etching of the SiO2 in buffered HF solution. Another metal (Ni) is deposited on the small wire to form a metal-to-metal junction that enables to measure the temperature at the tip end. Metal feed-through are formed on a glass substrate that is bonded with the probe array, which enables to transmit a high-speed signal to a processing-circuit and increase the probe array density. Using the thermal probe, temperature distribution on a sample surface is measured. The heating capability of nano-heater is confirmed by the resistivity change and thermophoton emission from the nano-heater when flowing a small current into the nano-heater. By using a micro-probe, preliminary experiment for data writing and erasing is performed on phase change medium.